In addition to surface analysis components LK Technologies specializes in the design and construction of complete UHV systems which often combine several surface analysis methods from LK components as well as other manufacturers.

Common elements of these systems are precision UHV chambers, a main pump (usually ion pump), an auxiliary pump (usually turbomolecular), a precision sample manipulator, a mounting framework and vacuum gauging. Optional components typically requested by the customer are a rapid sample introduction system (load lock) and bakeout control.

Please contact LK for more information and to discuss your custom system requirements. Below we show several examples of systems supplied in laboratories worldwide.

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Multiprobe analysis system consisting of XPS analysis with X-ray monochromator, hemispherical analyzer, AES, ISS, multichannel HREELS and full sample preparation chamber with rapid sample loading system.

Compact LEED/AES System with the Model RVL 2000 LEED, MINICMA™ Analyzer, NGI3000 Ion Gun and Sample Introduction System.

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Compact LEED/AES System with the Model RVL 2000 LEED, MINICMA™ Analyzer, NGI3000 Ion Gun and Sample Introduction System.

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Model EA5000MCA is our new and versatile high resolution analyzer for extremely rapid data recovery while maintaining high energy resolution. Shown here the analyzer is incorporated into a complete multichannel HREELS system with sample characterization and loading system.

Thermal Desorption TDS1000 System for materials analysis features a flexible design platform allowing other techniques such as LEED, AES and ion sputtering.

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Thermal Desorption TDS1000 System for materials analysis features a flexible design platform allowing other techniques such as LEED, AES and ion sputtering.

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